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VERSION:2.0
PRODID:icalendar-ruby
CALSCALE:GREGORIAN
X-WR-CALNAME:CLASSE Student Seminar - Arthur Campello
X-WR-TIMEZONE:Eastern Time (US & Canada)
BEGIN:VEVENT
DTSTAMP:20260717T232455Z
UID:tag:localist.com\,2008:EventInstance_4105820
DTSTART:20181116T190000Z
DTEND:20181116T200000Z
DESCRIPTION:CLASSE Student Seminar\n\nArthur Campello\, Cornell University\
 n\nAbstract:  \n\nDiamond crystals serve a wide array of technological app
 lications\, including as candidate materials for qubits\, for high power e
 lectronics\, as high-power radiation windows for optics\, and many others.
  Quantitative characterization of crystal defects is crucial for developme
 nt of the applications and for further advancements in materials science.\
 n\n\nCurrently\, few options exist for direct measurement/mapping of latti
 ce strain in the bulk of the crystal under in-situ conditions. With a comm
 only used technique\, white-beam x-ray topography\, nature of some lattice
  defects can be revealed and their strain features can be determined eithe
 r qualitatively or semi-quantitatively. Pairing inferences from white-beam
  topographs with a novel diffraction microscopy approach\, involving near-
 backscattering diffraction\, we can produce quantitative strain dilation m
 aps with ~ 1x10^{-8} strain resolution to further quantify underlying impe
 rfections. We report verifying the validity of this method by comparing me
 asured strains with those predicted by the linear theory of elasticity. Ad
 ditionally\, we have mapped the strain field of a previously unobserved di
 slocation type in diamond\, a predominately screw type with a dislocation 
 line direction close to [001].
GEO:42.445;-76.472862
LOCATION:Wilson Synchrotron Lab\, 301 Wilson Lab
SUMMARY:CLASSE Student Seminar - Arthur Campello
URL;VALUE=URI:https://events.cornell.edu/event/classe_student_seminar_-_art
 hur_campello
CATEGORIES:Seminar
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