Robert Suter from Carnegie Mellon University will be discussing:
Near-field High Energy Diffraction Microscopy: Requirements and Capabilities
Near-field High Energy Diffraction Microscopy (nf-HEDM) is a synchrotron based x-ray technique that images and spatially resolves diffraction from polycrystalline samples in three dimensions. High performance computing facilities are used to reconstruct the crystallographic orientation field on the ~2 micron length and 0.1 degree orientation scale. Cubic millimeter volumes can be measured in ~12 hours. Being non-destructive in hard materials (ex., metals, ceramics, composites), nf-HEDM provides the ability to track microstructural responses to a wide variety of materials processing conditions. These capabilities have been developed through a collaboration between the staff at Advanced Photon Source beam line 1-ID and my group at Carnegie Mellon. The talk will describe beam line requirements, data collection protocols, and forward modeling reconstructions of microstructural orientation fields. Examples of three dimensional data sets that follow material responses to thermal and mechanical treatments will be given. On-going developments at the APS that point towards increased experimental throughput will be described as will be efforts to allow combined orientation and elastic strain state mapping.
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